Use this interactive optical metrology lab to evaluate spatial frequency (R = 2^{G+(E-1)/6}), Modulation Transfer Function (MTF) contrast, Astigmatic Gaussian PSF Blur (\sigma_x, \sigma_y), and CMOS Nyquist Sensor Sampling across a standard MIL-STD-150A 1951 USAF Target, a calibrated U.S. Lincoln Cent (“Penny”), a 60 TPI Textile Weave, PCB Micro-Traces, or your own uploaded inspection images.

1951 USAF OPTICAL RESOLUTION & MTF METROLOGY ENGINE

High-Contrast MIL-STD-150A Schematics • Anisotropic 2D PSF Convolution • Real-Time MTF & Nyquist Verification

Target 1 of 5

OPTICAL TARGET 1: 1951 USAF RESOLUTION TEST CHART MIL-STD-150A Standard

OBJECT PLANE OVERVIEW Drag ROI reticle or click zone badge

Group -1 (0.50–0.89 lp/mm) Group 0 (1.00–1.78 lp/mm) Group 1 (2.00–3.56 lp/mm) Group 2 (4.00–7.13 lp/mm) Group 3 (8.00–14.25 lp/mm) Group 4 (16.0–28.5 lp/mm) Group 5 (32.0–57.0 lp/mm) Element 1 Element 2 Element 3 Element 4 Element 5 Element 6

SENSOR ROI INSPECTOR Eq: Group 2, Elem 4

ROI FOV: 1.08 mm Sampling: 3.7 px/feature

Sensor Pixel Grid Scan Crosshairs

All spatial dimensions calibrated to MIL-STD-150A. Eff. Object Pixel: 24.00 µm/px • Sensor Nyquist: 20.8 lp/mm

OPTICAL PSF ABERRATION & DIGITAL SENSOR SAMPLING CONTROLS

Adjust sagittal ($\sigma_x$) and tangential ($\sigma_y$) Gaussian blur, pixel size ($p_{\text{sensor}}$), and magnification ($M$).

Link $\sigma_x = \sigma_y$ (Symmetric PSF)

Sagittal Blur ($\sigma_x$) 12 µm

Tangential Blur ($\sigma_y$) 12 µm

Sensor Pixel Size ($p_{\text{sensor}}$) 24.0 µm

Optical Magnification ($M$) 1.0x

Veiling Glare / Flare 2%

Sensor Shot Noise ($\sigma_n$) 1%

METROLOGY SPECIFICATION & GOVERNING EQUATIONS

PASS: RESOLVED

Evaluating optical resolving power using the standard MIL-STD-150A governing equations:

$$R = 2^{\left(G + \frac{E-1}{6}\right)}\text{ lp/mm}, \qquad w = \frac{1000}{2R}\ \mu\text{m}, \qquad \text{MTF} = \frac{I_{\max} - I_{\min}}{I_{\max} + I_{\min}}$$

Both sagittal (X) and tangential (Y) profiles exceed the 20% Rayleigh criterion (Min MTF: 91%).

GIVEN TARGET & SENSOR PARAMETERS:

R_target = 5.66 lp/mm

w_feature = 88.39 µm

USAF_eq = Group 2, Elem 4

Pitch (2w) = 176.8 µm

p_eff (p/M) = 24.00 µm/px

f_Nyquist = 20.83 lp/mm

Sampling: 3.7 sensor px / feature Oversampled (3.7× Nyquist)

CROSS-SECTIONAL INTENSITY PROFILE & MTF PLOT

Michelson Contrast $C = (I_{\max} - I_{\min})/(I_{\max} + I_{\min})$ vs. $20\%$ Rayleigh Criterion

— Sagittal (X): 92% — Tangential (Y): 92%

GROUP 2 ELEMENT REFERENCE TABLE (CLICK ROW TO INSPECT)

Element	Freq (lp/mm)	Bar Width	MTF (Min)	Status